Optical Metrology 2019

SPIE Optical Metrology 2019

The premier European conference for the latest inventions and applications in the field of optical metrology.

Optical Metrology 2019 is organized by SPIE Europe Ltd.

Optical Metrology

The Optical Metrology conference organized by SPIE Europe focuses on the latest research in optical metrology, videometrics and machine vision with applications for solving measurement and inspection problems in industrial design and production engineering, vehicle navigation, multimedia technology, biotechnology, architecture, archaeology and arts.

Special emphasis is directed to model based, remote and active approaches, sensor fusion, robot guidance, image sequence processing, and scene modelling, characterization of biomaterials, as well as to the preservation of our shared cultural heritage.
Optical Metrology addresses attendees like engineers, scientists, researchers, trustees and managers.


Symposium Chair
Marc Georges
Université de Liège, Angleur (Liège), Belgium

Symposium Co-chair
Jörg Seewig
Technische Universität Kaiserslautern, Kaiserslautern, Germany

Conference topics
Optical Measurement Systems for Industrial Inspection XI
Chair: Peter Lehmann, Univ. Kassel (Germany)

Modeling Aspects in Optical Metrology VII
Chair: Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)

O3A: Optics for Art, Architecture, and Archaeology VII
Chairs: Haida Liang, Nottingham Trent Univ. (United Kingdom); Roger Groves, Technische Univ. Delft (Netherlands)

New: Multimodal Sensing and Artificial Intelligence: Technologies and Applications
Chair: Ettore Stella, CNR (Italy)

Optical Methods for Inspection, Characterization, and Imaging of Biomaterials IV
Chairs: Pietro Ferraro, Institute of Applied Sciences and Intelligent Systems (ISASI-CNR) (Italy); Simonetta Grilli, Institute of Applied Sciences and Intelligent Systems (ISASI-CNR) (Italy); Monika Ritsch-Marte, Medizinische Univ. Innsbruck (Austria); Christoph K. Hitzenberger, Medizinische Univ. Wien (Austria)

Automated Visual Inspection and Machine Vision IV
Chairs: Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany), Karlsruher Institut für Technologie (Germany); Fernando Puente León, Karlsruher Institut für Technologie (Germany)
Conference highlights

More information will be available soon.

Plenary Speakers

More information will be available soon.

Prizes and Awards

More information will be available soon.

About the Organizers

Organized by SPIE Europe

Sponsored by SPIE Europe and SPIE

In cooperation with WLT and EOS


SPIE Europe Office
2 Alexandra Gate
Ffordd Pengam, Cardiff, CF24 2SA
Tel.: +44 29 2089-4747
Fax: +44 29 2089-4750
E-Mail: info@spieeurope.org

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