Optical Metrology 2021

Logo Optical Metrology

The premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.

Optical Metrology 2021 is organized by SPIE.Europe

Optical Metrology will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts.

Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, and biomaterials characterization, as well as to the preservation of our shared cultural heritage.

Chairs

Symposium chair

  • Marc Georges, Université de Liège, Angleur (Liège), Belgium
  • Jörg Seewig, Technische Universität Kaiserslautern, Kaiserslautern, Germany


Symposium co-chair

  • Wolfgang Osten, Universität Stuttgart, Stuttgart, Germany

Conference topics

Optical Measurement Systems for Industrial Inspection XII Peter Lehmann, Universität Kassel, Germany
Co-Chairs:
Wolfgang Osten, Universität Stuttgart, Germany
Armando Albertazzi Gonçalves, Universidade Federal de Santa Catarina, Florianópolis, Brazil
Modeling Aspects in Optical Metrology VIII Bernd Bodermann, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany
Co-Chairs:
Karsten Frenner, Institut für Technische Optik, Stuttgart, Germany
Bryan M. Barnes, National Institute of Standards and Technology, Gaithersburg, USA
Optics for Arts, Architecture, and Archaeology (O3A) VIII Haida Liang, Nottingham Trent University, United Kingdom
Roger Groves, Technische Universiteit Delft, Netherlands
Multimodal Sensing and Artificial Intelligence: Technologies and Applications II Ettore Stella, CNR, Bari, Italy
Co-Chairs:
Shahriar Negahdaripour, University of Miami, USA
Dariusz Ceglarek, The University of Warwick, United Kingdom
Christian Möller, Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung, Bremen, Germany
Optical Methods for Inspection, Characterization, and Imaging of Biomaterials V Pietro Ferraro, Institute of Applied Sciences and Intelligent Systems (ISASI-CNR), Pozzuoli, Italy
Simonetta Grilli, Institute of Applied Sciences and Intelligent Systems (ISASI-CNR), Pozzuoli, Italy
Monika Ritsch-Marte, Medizinische Universität Innsbruck, Austria
Christoph K. Hitzenberger, Medizinische Univer-sität Wien, Austria
Automated Visual Inspection and Machine Vision IV Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB, Karlsruher Institut für Technologie, Karlsruhe, Germany
Michael Heizmann, Karlsruher Institut für Technologie, Karlsruhe, Germany

About the organizer

SPIE, the international society for optics and photonics, was founded in 1955 to advance light-based technologies.

Serving 255,000 constituents from 183 countries, the not-for-profit society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth.

The SPIE international office is located in Bellingham, Washington and the SPIE Europe office is located in Cardiff, Wales

  • Organized by SPIE.Europe
  • Sponsored by SPIE.
  • In cooperation with EOS – European Optical Society and Lasers in Manufacturing – LiM 2021

Contact

SPIE Europe Office
2 Alexandra Gate
Ffordd Pengam, Cardiff, CF24 2SA
Tel.: +44 29 2089-4747
Fax: +44 29 2089-4750
E-mail: info@spieeurope.org

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