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Optical Metrology 2021

The premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.

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About & Highlights

About

SPIE Optical Metrology—A digital forum for the latest research in measurement systems, modeling, videometrics, and inspection

21–25 June 2021, CEST time schedule

Optical Metrology will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts.

Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, and biomaterials characterization, as well as to the preservation of our shared cultural heritage.

Conference management is provided by SPIE Europe, 2 Alexandra Gate Ffordd Pengam, Cardiff, CF24 2SA Wales, United Kingdom (Email: customerservice@spie.org or info@spieeurope.org)

Highlights

SPIE Optical Metrology features world-class plenary and keynote speakers:

Dr. Peter J. de Groot, Zygo Corporation
© Dr. Peter J. de Groot, Zygo Corporation
Dr. Peter de Groot
Executive Director, R&D
Dr. Peter J. de Groot, Zygo Corporation
© Dr. Peter J. de Groot, Zygo Corporation

Executive Director, R&D
Zygo Corporation, United States

Dr. Peter de Groot

Peter de Groot, PhD is the Executive Director of R&D at Zygo Corporation, a world leader in the design and manufacture of optics and metrology systems. In addition to 140 patents for optical measuring instruments and techniques, Peter has published 180 technical papers, tutorials, and book chapters in physics, education, optics and metrology. He is an honorary professor at the University of Nottingham, a Fellow and Director of the SPIE, an SPIE Kingslake award winner, and an active contributor in the optics community.

Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production.

Even though there are clear benefits, there are obstacles to the more widespread adoption of optical techniques for dimensional measurements. Many of these obstacles are technical--such as vibration sensitivity and metrological traceability; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in advancing optical methods for the most critical needs of data-driven manufacturing.

23 June 2021 • 16:30 - 17:30 CEST

SPIE Optical Metrology Plenary

Optical sociology—How organizational culture impacts advances in optical metrology
Peter J. de Groot, Zygo Corporation, United States

SPIE Optical Metrology Keynotes

Shaping the future of biomedical imaging
Kishan Dholakia, University of St Andrews, United Kingdom

Detecting nanoscale perturbations using new forms of optical microscopy
Lynford L. Goddard, University of Illinois, United States

Stain-free 4D imaging of live sperm cells: the future of in-vitro fertilization
Natan Tzvi Shaked, Tel Aviv Univ., Israel

Seeing deep into engineered samples with dual-axis OCT
Adam P. Wax, Duke University, United States

In addition, the conference also offers a series of online courses related to topics within Optical Metrology. Here you can find more information

Program schedule at a glance

Please see the conference tracks and sessions of the SPIE.Optical Metrolog below.

On-demand starting 21 June, 2021

  • Session 1: In-process and In-situ Measurement
  • Session 2: High-speed Technologies
  • Session 3: Displacement, Deformation, and Vibration Measurement
  • Session 4: Digital Holography
  • Session 5: Measurement Uncertainty and Material Measures in 3D Microscopy
  • Session 6: 3D Microscopy
  • Session 7: Nondestructive Testing
  • Session 8: Interferometric Techniques
  • Session 9: Measurement/Characterization of Optical Components and Systems
  • Session 10: Novel Sensor and Sensor Characterization I
  • Session 11: Novel Sensor and Sensor Characterization II
  • Session 12: Fringe Projection, Structured Light, Triangulation, and Photogrammetry
  • Poster Session

  • Session KS: Keynote Presentation
  • Session 1: Scattered Light and Gratings
  • Session 2: Modelling of Optical Systems
  • Session 3: Imaging Systems and Microscopy
  • Session 4: Metrology and Ellipsometry
  • Poster Session

  • Session 1: Machine Learning and Data Visualisation
  • Session 2: Imaging and Spectroscopy Instrument and Method Development
  • Session 3: Deformation and Structural Analysis
  • Session 4: Light-Matter Interaction
  • Session 5: 3D Tomography
  • Session 6: Ground-based and Airborne Remote Imaging and Spectroscopy
  • Session 7: Applications to Art, Archaeology, Architecture and Anthropology
  • Session 8: Multimodal Imaging and Spectroscopy
  • Session 9: 3D Surface Analysis
  • Poster Session

  • Session 1: Multimodal Sensing for Infrastructure Monitoring
  • Session 2: Multimodal Sensing Technology
  • Session 3: Human Pose and Object Tracking
  • Session 4: Multimodal Images for Remote Sensing
  • Session 5: Machine Learning Applications
  • Session 6: Multimodal Sensing Applications
  • Session 7: Multimodal Sensing for Cultural Heritage

  • Session 1: Imaging in Microfluidics
  • Session 2: Digital Holographic Microscopy I
  • Session 3: Digital Holographic Microscopy II
  • Session 4: Micromanipulation
  • Session 5: Biomaterial Fabrication
  • Session 6: Phase Microscopy and Tomography
  • Session 7: Tissue Imaging
  • Session 8: Imaging
  • Session 9: Biophotonics and Additive Manufacturing Technologies for 3D Health Monitoring
  • Session 10: Scaffolds and Advanced Materials
  • Session 11: FET-Open on Disruptive Ideas and Optical Technologies for Health
  • Poster Session

The 2021 conference will be held in honor of Professor Fernando Puente León.

  • Session 1: Machine Learning and Classification
  • Session 2: Image-based Measurement Technology
  • Poster Session

The complete conference program of SPIE Optical Metrology - sorted by conferences, presentation types and days – can be found here:

Registration & digital platform

You would like to participate in Optical Metrology 2021?

Please use the following website to inform yourself about the conference fees and to register:

Chairs

Symposium chair

  • Marc Georges, Université de Liège, Angleur (Liège), Belgium
  • Jörg Seewig, Technische Universität Kaiserslautern, Kaiserslautern, Germany


Symposium co-chair

  • Wolfgang Osten, Universität Stuttgart, Stuttgart, Germany

About the organizer

SPIE, the international society for optics and photonics, was founded in 1955 to advance light-based technologies.

Serving 255,000 constituents from 183 countries, the not-for-profit society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth.

The SPIE international office is located in Bellingham, Washington and the SPIE Europe office is located in Cardiff, Wales

  • Organized by SPIE.Europe
  • Sponsored by SPIE.
  • In cooperation with EOS – European Optical Society and Lasers in Manufacturing – LiM 2021

Contact

SPIE Europe Office
2 Alexandra Gate
Ffordd Pengam, Cardiff, CF24 2SA
Tel.: +44 29 2089-4747
Fax: +44 29 2089-4750
E-mail: info@spieeurope.org

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